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Other ILC R&D @ JLab summaries

Table of accreting data from JLab cavity tests

-- Summary highlights --

 

Nb Cavity Electropolishing R&D - 9-cell cavities

Defect(s) in AES3 located

AES3 had a limiting gradient of about 18 MV/m due to quench in past tests. The quench limit remains unchanged despite repeated surface removal by EP. Pass-band mode measurements consistently revealed that the quench source resides in cell#4 and/or #6. Additional RF test with 8 thermometers (4 each on cell #4 and #6) singled out cell #6 is the culprit. The final RF test with 16 thermometers attached in the suspected region in cell #6 (Fig. 1) was successfully completed after another 20 micron surface removal by EP. At about 20 MV/m, the cavity quench limit was reached with clearly correlated temperature responses in thermometers. We concluded that the defect is near but outside the equator weld of cell #6. The success of the last RF test also verified the hypothesis of “well-defined local defect” (such as a geometrically suppressed area). AES3 is now under preparation for additional HPR and will be shipped to FNAL under vacuum for additional RF test.
AES3 with Thermometry
Fig. 1 AES3 RF test with 16 thermometers. Defect is located near, but outside, the equator weld of cell #6, counted from the field probe port side.

AES2 performance improved with more surface removal

AES2 was previously limited by quench in the gradient range of 18 – 20 MV/m. Pass-band mode measurements revealed that quench limit was reached equally in cell #5, cell pair #4/#6, and cell pair #2/#8. This “global” nature of quench limit in AES2 contrasts sharply with the “well-defined” nature of quench limit in AES1 and AES3. This leads to the hypothesis that the sheets used for AES2 have defects, which might be removed by further material removal. During the recent test after additional 20 micron surface removal by EP, AES2 reached a quench limit of 26 MV/m. This seems to verify the hypothesis and encourages more material removal for further performance improvement. AES2 has been processed with another 20 micron by EP and is waiting for a next RF test when the busy VTA dewars become available. Based on the behavior of AES2, it is likely that its limiting gradient can be further improved by applying the post-purification technology. Improving the limiting gradient in EP’ed cavities by post-purification has been not systematically explored but remains highly interesting. We plan to post-purify AES2 at JLab and test again after additional EP.       

A8 reached 32 MV/m

A8 reached 32 MV/m without field emission after the 3rd 20 micron EP at JLab (Fig. 2).
Previously, A8 reached a quench limit of 31 MV/m at Cornell. Since then the cavity was processed and tested several times at Cornell before shipping to JLab. The last test at Cornell was limited by a Q-slope caused by off-normal parameters during the final EP. This result was confirmed during the initial baseline test at JLab. (The Q-slope bearing RF surface appears to be matted in contrast to the normal shiny surface.) After the first 20 micron EP at JLab, the Q-slope seemed to still exist. During the second test following the second 20 micron EP, the cavity had early field emission onset due to contamination. Because of this, it was impossible to evaluate the change in Q-slope. The success of the 3rd test following the 3rd 20 micron EP implies that 60 micron EP is the upper limit for removing the initial Q-slope. Although it is premature to speculate the mechanism of the Q-slope in A8, it is worthwhile to mention a similar Q-slope observed earlier in the cavity A6 EP processed at JLab. In that case, the RF surface also appeared to be matt due to off-normal EP parameters and the Q-slope was successfully removed by a 20 micron surface removal with nominal EP parameters. Exploration of the mechanism behind this apparent Q-slope is a possible topic for our FY08 single-cell cavity EP program.        
A8 3rd test
Fig. 2 A8 reached 32 MV/m after 3rd 20 micron EP at JLab. There was no field emission and the limit was repetitive quench.

ICHIRO5 ready for first EP processing at JLab

Since ICHIRO5 was received by JLab, it was first tuned for field flatness and the baseline test was completed after HPR only. The low-field Q of the baseline test was higher than expected. This prompted rigorous measurement system investigation and error analysis. No smoking gun was fund to invalidate the original result. ICHIRO5 was retested in the same dewar after warming up to room temperature. The low-field Q during the retest reached a “nominal” value, but there was field emission activation near the highest gradient. Nevertheless, by scaling the original low-field Q to that of the retest, ICHIRO5 reached a gradient of 30 – 33 MV/m. This is corroborated by the independent analysis based on the Lorentz force detuning. Next step is to EP ICHIRO5 (Fig. 3) for a 20 micron removal followed by RF test.

ICHIRO5 in JLab EP System
Fig. 3 ICHIRO5 mounted in the EP machine at JLab

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Nb Cavity Electropolishing R&D - 1-cell cavities

No current activities on this topic - planning has begun

Large- and Single-grain Nb R&D

Fabrication of two 9-cell ILC cavities from large-grain Nb material

Both large grain cavities have been tested twice after the following treatments and a third test with cavity #1 is in progress:

    • Pre-tuning100 micron bcp
    • Hydrogen degassing at 600 C for 10 hrs
    • Final tuning
    • Final bcp, removing 40 –60 micron of material from the surface initially and app. 20 micron in subsequent preparation
    Figure 4 shows the result from both tests with cavity #1, during test #1 some problems with the cavity vacuum system were encountered, leading to a strong field limitation at  ~ 9 MV/m.

Lg Grain perf 1

zLg Grain perf 2

The results from both tests with cavity #2 are plotted in figure 5.
As can be seen, neither cavity performed very well and both quenched early. We attribute this “inferior” performance to manufacturing problems during electron beam welding: both cavities developed holes during equator welding. Through mode analysis we have identified the cells, which cause the problem, but the quench locations have not yet been identified.

Re-tests of both cavities are planned after post-purification heat treatments at 1250 C for 3 hrs in the presence of Ti as a solid state getter material. We hope that an increase in the thermal conductivity of the niobium will stabilize the material and
permit a higher quench field.Return to top of page

Single Cell studies with Large Grain Niobium

Ningxia:     119 mT< Hq < 155mT Average: < 141mT>
Heraeus:    125 mT< Hq < 166mT Average: < 147 mT>


Nangxia       

Hearaus 

A paper about the results of these studies has been published. Return to top of page


Superconducting Joint

SCJoint

Thermometry

Two sets of single-cell thermometry for Tesla-style cells are in fabrication. They will be available for use in localizing performance-limiting defects in future ILC R&D cavities.

Polycrystaline Nb 9-cell Cavity Fabrication

Two 9-cell ILC cavities using standard polycrystaline Nb are under fabrication at JLab

Both cavities are app. 75 % complete. Problems with the welding of the helium vessel end dishes and the HOM couplers need to be resolved before the cavities can be completed.

It is anticipated that the fabrication of both cavities will be completed by March 2008.

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Contamination Control

Contamination and other studies of Nb surfaces EP’ed together with 9-cell cavity getting first results

Two aspects of EP’ed surface are of interest. One is surface contaminants that become field emitters under a high surface electric field. The other is variation of surface properties (geometrical or compositional) that becomes a source of early quench under a high surface magnetic field. Fundamental surface studies are necessary to address these issues. Currently, we are focused on contamination studies by investigating Nb samples electropolished together with 9-cell real cavities. The advantage of this study is that the sample surface experiences the same EP process of a real 9-cell cavity. This gives the possibility to correlate the surface contamination properties of the sample with the field emission behavior of the cavity.    

Two Nb samples have been produced by using the above mentioned method. To characterize the field emitters on the sample surface, we use the existing Scanning Field Emission Microscope (SFEM) at the Surface Science Lab of JLab’s SRF Institute. Figure 9 gives an example result, showing the field emitters on the original post-EP surface. Individual field emitter can be analyzed with the integrated SEM in the SFEM system. The sample surface will go through ultrasonic cleaning with Micro-90 and HPR (same procedure for a real cavity) and SFEM analysis will be repeated to characterize changes in field emitters. Through these surface studies, we expect to establish an understanding of the effectiveness of these post-EP cleaning procedure (initial JLab ILC 9-cell experience has shown impressive success with ultrasonic cleaning with Micro-90 solution). Ultimately we expect to establish an optimal post-EP cleaning procedure, for example the optimal concentration of micro-90 and optimal HPR duration etc.

Field emission scan
Figure 9. Field emitters on the original surface of a Nb sample electropolished together with a 9-cell ILC cavity. A high DC surface field up to 140 MV/m is applied to the sample surface by using JLab’s SFEM to disclose field emitters. Each field emitter can be analyzed by transferring the sample from the field emitter scanning chamber into the SEM chamber of the SFESEM.

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Electropolishing Process R&D

Improving the characterization of the basic electrochemical process, surface effects, and their association to techniques applied to cavities

Talk from SRF2007 summarizing recent R&D progress:

"Improved Characterization of the Electropolishing of Niobium with Sulfuric and Hydrofluoric Acid Mixtures, Hui Tian (College of William and Mary, and JLab)" download

Manuscript in preparation.

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